Judit Freijedo
According to our database1,
Judit Freijedo
authored at least 16 papers
between 2007 and 2013.
Collaborative distances:
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Bibliography
2013
Proceedings of the 23rd International Conference on Field programmable Logic and Applications, 2013
2012
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits.
J. Electron. Test., 2012
2011
Lower <i>V</i><sub>DD</sub> Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing.
J. Low Power Electron., 2011
Programmable sensor for on-line checking of signal integrity in FPGA-based systems subject to aging effects.
Proceedings of the 12th Latin American Test Workshop, 2011
Modeling the effect of process variations on the timing response of nanometer digital circuits.
Proceedings of the 12th Latin American Test Workshop, 2011
Proceedings of the International Conference on Field Programmable Logic and Applications, 2011
2010
J. Low Power Electron., 2010
2009
Measuring clock-signal modulation efficiency for Systems-on-Chip in electromagnetic interference environment.
Proceedings of the 10th Latin American Test Workshop, 2009
Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies.
Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009
2008
J. Low Power Electron., 2008
Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems.
J. Low Power Electron., 2008
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits.
Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008
2007
Proceedings of the 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), 2007
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits.
Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007