Juan-David Guerrero-Balaguera

Edward Javier Patiño Nuñez

J. Electron. Test., April, 2024

Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations.

[BibT_eX]

[DOI]

Francesco Pessia

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Evaluating the Reliability of Supervised Compression for Split Computing.

[BibT_eX]

[DOI]

Mohammad Hasan Ahmadilivani

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Special Session: Reliability Assessment Recipes for DNN Accelerators.

[BibT_eX]

[DOI]

Alberto Bosio

Bastien Deveautour

Mahdi Taheri

Marcello Traiola

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs.

[BibT_eX]

[DOI]

Luis Ariel Mesa

Wilson-Javier Pérez-Holguín

Erika D. Castañeda

Ernesto Sánchez

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Assessing the Reliability of Different Split Computing Neural Network Applications.

[BibT_eX]

[DOI]

Giuseppe Esposito

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Effective Application-level Error Modeling of Permanent Faults on AI Accelerators.

[BibT_eX]

[DOI]

Francesco Pessia

Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

Enhancing the Reliability of Split Computing Deep Neural Networks.

[BibT_eX]

[DOI]

Giuseppe Esposito

Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations.

[BibT_eX]

[DOI]

Proceedings of the IEEE European Test Symposium, 2024

2023

STLs for GPUs: Using High-Level Language Approaches.

[BibT_eX]

[DOI]

IEEE Des. Test, August, 2023

Using STLs for Effective In-Field Test of GPUs.

[BibT_eX]

[DOI]

Felipe Augusto da Silva

Ahmet Çagri Bagbaga

Said Hamdioui

Christian Sauer

IEEE Des. Test, April, 2023

Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs.

[BibT_eX]

[DOI]

Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023

Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units.

[BibT_eX]

[DOI]

Josie Esteban Rodriguez Condia

Paolo Rech

Proceedings of the International Conference for High Performance Computing, 2023

Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs.

[BibT_eX]

[DOI]

Edward Javier Patiño Nuñez

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems.

[BibT_eX]

[DOI]

Ian Harshbarger

Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023

Evaluating the Prevalence of SFUs in the Reliability of GPUs.

[BibT_eX]

[DOI]

Edward Javier Patiño Nuñez

Proceedings of the IEEE European Test Symposium, 2023

A Reliability-aware Environment for Design Exploration for GPU Devices.

[BibT_eX]

[DOI]

Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2022

Characterizing a Neutron-Induced Fault Model for Deep Neural Networks.

[BibT_eX]

[DOI]

Josie Esteban Rodriguez Condia

Angeliki Kritikakou

Olivier Sentieys

Paolo Rech

CoRR, 2022

A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability.

[BibT_eX]

[DOI]

Paolo Rech

Proceedings of the IEEE International Test Conference, 2022

Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference in Asia, 2022

Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections.

[BibT_eX]

[DOI]

Luigi Galasso

Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022

Effective fault simulation of GPU's permanent faults for reliability estimation of CNNs.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Neural Network's Reliability to Permanent Faults: Analyzing the Impact of Performance Optimizations in GPUs.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE International Conference on Electronics, Circuits and Systems, 2022

A Compaction Method for STLs for GPU in-field test.

[BibT_eX]

[DOI]

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Using Hardware Performance Counters to support infield GPU Testing.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International Conference on Electronics, 2021

On the Functional Test of Special Function Units in GPUs.

[BibT_eX]

[DOI]

Proceedings of the 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2021

A Novel Compaction Approach for SBST Test Programs.

[BibT_eX]

[DOI]