Ju-Youn Kim
According to our database1,
Ju-Youn Kim
authored at least 2 papers
between 2021 and 2023.
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Bibliography
2023
Highly Reliable/Manufacturable 4nm FinFET Platform Technology (SF4X) for HPC Application with Dual-CPP/HP-HD Standard Cells.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
2021
Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2021