Joyati Mondal

According to our database, Joyati Mondal authored at least 10 papers between 2013 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Design-for-testability for reversible logic circuits based on bit-swapping.

Joyati Mondal, Debesh Kumar Das, Bhargab B. Bhattacharya

IET Quantum Commun., June, 2024

2022

A new online testing technique for reversible circuits.

Joyati Mondal, Debesh Kumar Das

IET Quantum Commun., March, 2022

DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits.

Joyati Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das, Bhargab B. Bhattacharya

J. Circuits Syst. Comput., 2022

2021

An Efficient Design for Testability Approach of Reversible Logic Circuits.

Joyati Mondal, Arighna Deb, Debesh K. Das

J. Circuits Syst. Comput., 2021

2020

An Improved Online Testing Technique For Reversible Circuits.

Joyati Mondal, Debesh Kumar Das

Proceedings of the 3rd International Symposium on Devices, Circuits and Systems, 2020

2019

Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits.

Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das

J. Circuits Syst. Comput., 2019

2017

Design for Testability Technique of Reversible Logic Circuits Based on Exclusive Testing.

Joyati Mondal, Debesh Kumar Das

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2015

Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits.

Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2013

On Designing Testable Reversible Circuits Using Gate Duplication.

Joyati Mondal, Debesh Kumar Das, Dipak Kumar Kole, Hafizur Rahaman, Bhargab B. Bhattacharya

Proceedings of the VLSI Design and Test, 17th International Symposium, 2013

A design for testability technique for quantum reversible circuits.

Joyati Mondal, Debesh K. Das, Dipak Kumar Kole, Hafizur Rahaman

Proceedings of the East-West Design & Test Symposium, 2013