Joy Y. Liao

According to our database, Joy Y. Liao authored at least 5 papers between 2005 and 2020.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2020

Impact of X-Ray Radiation on the Reliability of Logic Integrated Circuits.

Somayyeh Rahimi, Christian Schmidt, Joy Y. Liao, Howard Lee Marks, Kyung Mo Shin

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2010

Scan chain failure analysis using laser voltage imaging.

Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng

Microelectron. Reliab., 2010

2009

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing.

Joy Y. Liao, Tung Ton, Nathan Slattengren, Steven Kasapi, William K. Lo, Howard L. Marks, Yin S. Ng, Ted R. Lundquist

Microelectron. Reliab., 2009

2007

OBIRCH analysis of electrically stressed advanced graphic ICs.

Joy Y. Liao, Howard L. Marks, F. Beaudoin

Microelectron. Reliab., 2007

2005

Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System.

Joy Y. Liao, G. L. Woods, X. Chen, Howard L. Marks

Microelectron. Reliab., 2005