Joseph Versaggi

According to our database, Joseph Versaggi authored at least 7 papers between 2014 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement.

Nishtha S. Gaul, Akhilesh Jaiswal, Hongsik Yoon, Taeyoung Lee, Kazutaka Yamane, Joseph Versaggi, Rick Carter, Bipul C. Paul

Proceedings of the IEEE International Memory Workshop, 2022

2020

Bias-Dependent Variation in FinFET SRAM.

Randy W. Mann, Meixiong Zhao, Oh Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter

IEEE Trans. Very Large Scale Integr. Syst., 2020

2019

An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.

Randy W. Mann, Meixiong Zhao, Sanjay Parihar, Qun Gao, Ankur Arya, Carl Radens, Shesh Mani Pandey, Joseph Versaggi, Jack M. Higman, Rick Carter

IEEE Trans. Very Large Scale Integr. Syst., 2019

2018

A Retrospective View on the Technology Evolution to Support Low Power Mobile Application.

Bipul C. Paul, Ajey P. Jacob, William Taylor, Randy W. Mann, Joseph Versaggi, Edward J. Nowak, Lars W. Liebmann

J. Low Power Electron., 2018

2017

Array Termination Impacts in Advanced SRAM.

Randy W. Mann, Sandeep Puri, Sheng Xie, Daniel Marienfeld, Joseph Versaggi, Bianzhu Fu, Michael Gribelyuk, Ratheesh R. Thankalekshmi, Xiaoqiang Zhang, Hui Zang, Chad E. Weintraub

IEEE Trans. Very Large Scale Integr. Syst., 2017

Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays.

Randy W. Mann, William McMahon, Yoann Mamy Randriamihaja, Yuncheng Song, Ajay Anand Kallianpur, Sheng Xie, Akhilesh Gautam, Joseph Versaggi, Biju Parameshwaran, Chad E. Weintraub

IEEE Trans. Very Large Scale Integr. Syst., 2017

2014

HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014