Joseph B. Bernstein

According to our database, Joseph B. Bernstein authored at least 20 papers between 1990 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

The Correct Hot Carrier Degradation Model.

Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan

Proceedings of the IEEE International Reliability Physics Symposium, 2023

The Effects of Process Variations and BTI in Packaged FinFET Devices.

Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2021

Microchip Health Monitoring System Using the FLL Circuit.

Emmanuel Bender, Joseph B. Bernstein

Sensors, 2021

2018

An improved reliability model for Si and GaN power FET.

Gady Golan, Moshe Azoulay, Tsuriel Avraham, Ilan Kremenetsky, Joseph B. Bernstein

Microelectron. Reliab., 2018

2017

Reliability prediction with MTOL.

Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender

Microelectron. Reliab., 2017

2014

Reliability matrix solution to multiple mechanism prediction.

Joseph B. Bernstein, Moti Gabbay, Ofir Delly

Microelectron. Reliab., 2014

2012

Structural health monitoring of solder joints in QFN package.

I. Gershman, Joseph B. Bernstein

Microelectron. Reliab., 2012

2011

Hardware Error Likelihood Induced by the Operation of Software.

Bing Huang, Manuel Rodríguez, Ming Li, Joseph B. Bernstein, Carol S. Smidts

IEEE Trans. Reliab., 2011

2009

Assessment of acceleration models used for BGA solder joint reliability studies.

Liyu Yang, Joseph B. Bernstein, T. Koschmieder

Microelectron. Reliab., 2009

Failure rate estimation of known failure mechanisms of electronic packages.

Liyu Yang, Joseph B. Bernstein

Microelectron. Reliab., 2009

2006

Electronic circuit reliability modeling.

Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor

Microelectron. Reliab., 2006

2005

Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides.

John S. Suehle, Baozhong Zhu, Yuan Chen, Joseph B. Bernstein

Microelectron. Reliab., 2005

Study of the Impact of Hardware Fault on Software Reliability.

Bing Huang, Xiaojun Li, Ming Li, Joseph B. Bernstein, Carol S. Smidts

Proceedings of the 16th International Symposium on Software Reliability Engineering (ISSRE 2005), 2005

Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature.

Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein

Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE.

Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein

Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

2004

A High Performance Radiation-Hard Field Programmable Analog Array .

Ji Luo, Joseph B. Bernstein, J. Ari Tuchman, Hu Huang, Kuan-Jung Chung, Anthony L. Wilson

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004

Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field.

Hu Huang, Joseph B. Bernstein, Martin Peckerar, Ji Luo

Proceedings of the 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 2004

2002

Reliable Laser Programmable Gate Array Technology.

Zhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. Bernstein

Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

1998

Laser formed connections for programmable wiring.

Joseph B. Bernstein, Wei Zhang, Carl H. Nicholas

Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998

1990

Electrical characterization of polymeric insulation by electrically stimulated acoustic wave measurements.

Joseph B. Bernstein

PhD thesis, 1990