Joseph A. Reynick

Orcid: 0000-0002-3215-1212

According to our database1, Joseph A. Reynick authored at least 4 papers between 2004 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2022
Affordable and Comprehensive Testing of 3-D Stacked Die Devices.
IEEE Des. Test, 2022

2021
Proposed Standardization of Heterogenous Integrated Chiplet Models.
Proceedings of the IEEE International 3D Systems Integration Conference, 2021

2019
Innovative Practices on DFT for AI Chips.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

2004
Investment vs. Yield Relationship for Memories and IP in SOC.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004


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