Josef Kinseher
Orcid: 0000-0001-6923-1059
According to our database1,
Josef Kinseher
authored at least 7 papers
between 2013 and 2019.
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Bibliography
2019
IEEE Trans. Emerg. Top. Comput., 2019
2017
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017
2016
Proceedings of the 21th IEEE European Test Symposium, 2016
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
2015
Proceedings of the 24th IEEE Asian Test Symposium, 2015
2013
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013