José Vicente Calvano

According to our database, José Vicente Calvano authored at least 17 papers between 2000 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2007

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell

J. Electron. Test., 2007

2006

Functional Test of Field Programmable Analog Arrays.

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Using Swarm Intelligence to Solve Some Analog Test Issues.

Carlos E. F. Savioli, Claudio E. C. Szendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho

Proceedings of the 7th Latin American Test Workshop, 2006

2005

Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits.

Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho

Proceedings of the 2005 Design, 2005

2004

ATPG for fault diagnosis on analog electrical networks using evolutionary techniques.

Carlos Eduardo Savioli, Claudio C. Czendrodi, José Vicente Calvano, Antonio Carneiro de Mesquita Filho

Proceedings of the 17th Annual Symposium on Integrated Circuits and Systems Design, 2004

2003

Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors.

José Vicente Calvano, Marcelo Lubaszewski

Proceedings of the 3rd IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC'03), 30 June, 2003

2002

Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.

José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

State Model Approach for Analog Fault Modeling.

José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves

Proceedings of the 3rd Latin American Test Workshop, 2002

Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho

Proceedings of the 3rd Latin American Test Workshop, 2002

2001

Fault Models and Test Generation for OpAmp Circuits - The FFM.

José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski

J. Electron. Test., 2001

Filter Sensitivity Analysis Using the TRAM.

José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 2nd Latin American Test Workshop, 2001

Designing Testable Networks for Transfer Function Realization.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho

Proceedings of the 2nd Latin American Test Workshop, 2001

2000

Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Fault Models and Compact Test Vectors for MOS OpAmp circuits.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho

Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

The Use of Macromodels on Op-Amp Circuits Fault Modeling.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 1st Latin American Test Workshop, 2000

Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski

Proceedings of the 1st Latin American Test Workshop, 2000

Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000