Joschka zur Jacobsmühlen

Orcid: 0000-0003-4183-360X

Affiliations:
  • RWTH Aachen University, Germany (PhD 2018)


According to our database1, Joschka zur Jacobsmühlen authored at least 10 papers between 2009 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

Online presence:

On csauthors.net:

Bibliography

2018
Image-based methods for inspection of laser beam melting processes.
PhD thesis, 2018

2017
Compound quality assessment in laser beam melting processes using layer images.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017

2016
Robust calibration marker detection in powder bed images from laser beam melting processes.
Proceedings of the IEEE International Conference on Industrial Technology, 2016

2015
Detection of elevated regions in surface images from laser beam melting processes.
Proceedings of the IECON 2015, 2015

2014
Robustness analysis of imaging system for inspection of laser beam melting systems.
Proceedings of the 2014 IEEE Emerging Technology and Factory Automation, 2014

2013
Mechanical Properties of Laser Beam Melting Components Depending on Various Process Errors.
Proceedings of the Digital Product and Process Development Systems, 2013

On benchmarking non-blind deconvolution algorithms: A sample driven comparison of image de-blurring methods for automated visual inspection systems.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

High resolution imaging for inspection of Laser Beam Melting systems.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

2012
Detection of immunocytological markers in photomicroscopic images.
Proceedings of the Medical Imaging 2012: Computer-Aided Diagnosis, San Diego, 2012

2009
Efficient implementations from libraries: Analyzing the influence of configuration parameters on key performance properties.
Proceedings of the IEEE 20th International Symposium on Personal, 2009


  Loading...