Joosung Kim

According to our database, Joosung Kim authored at least 2 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Reliability on EUV Interconnect Technology for 7nm and beyond.

Tae-Young Jeong, Miji Lee, Yunkyung Jo, Jinwoo Kim, Min Kim, Myungsoo Yeo, Jinseok Kim, Hyunjun Choi, Joosung Kim, Yoojin Jo, Yongsung Ji, Taiki Uemura, Hai Jiang, Dongkyun Kwon, HwaSung Rhee, Sangwoo Pae, Brandon Lee

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2013

High optical density and low dielectric constant black matrix containing graphene oxide and carbon black on color filters.

Thanh Son Bui, Joosung Kim, EnJu Jung, Hoang Sinh Le, Ngoc Trung Nguyen, Jin-Young Bae

Displays, 2013