Joonsung Park
According to our database1,
Joonsung Park
authored at least 17 papers
between 2006 and 2021.
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Bibliography
2021
ACM Trans. Design Autom. Electr. Syst., 2021
2019
Proceedings of the 24th IEEE European Test Symposium, 2019
2017
High precision yet wide range on-chip oscillator with dual charge-discharge technique.
Proceedings of the 18th International Symposium on Quality Electronic Design, 2017
A 12-/14-bit, 4/2MSPS, 0.085mm<sup>2</sup> SAR ADC in 65nm using novel residue boosting.
Proceedings of the 2017 IEEE Custom Integrated Circuits Conference, 2017
2016
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016
2015
An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4<sup>°</sup>C (3σ) From - 40<sup>°</sup>C to 130<sup>°</sup>C.
IEEE J. Solid State Circuits, 2015
2013
IEEE Trans. Very Large Scale Integr. Syst., 2013
2011
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model.
J. Electron. Test., 2011
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
J. Electron. Test., 2011
2010
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
J. Electron. Test., 2010
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate.
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
Proceedings of the 14th IEEE European Test Symposium, 2009
LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits.
Proceedings of the Eighteentgh Asian Test Symposium, 2009
2008
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008
2007
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007
2006
Proceedings of the 2006 IEEE International Test Conference, 2006