Jongsun Bae

According to our database, Jongsun Bae authored at least 2 papers in 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress.

Jongsun Bae, Sanghyeon Baeg, Sungju Park

IEEE Trans. Instrum. Meas., 2012

Soft Error Issues with Scaling Technologies.

Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam

Proceedings of the 21st IEEE Asian Test Symposium, 2012