Jongsoo Yim

According to our database, Jongsoo Yim authored at least 1 paper in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

A Prevenient Voltage Stress Test Method for High Density Memory.

Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008