Jongsin Yun

According to our database1, Jongsin Yun authored at least 10 papers between 2020 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

2020
2021
2022
2023
2024
0
1
2
3
4
5
4
2
1
1
2

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

MBIST-based MRAM defect screening for safety-critical applications.
Proceedings of the IEEE International Test Conference, 2024

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies.
Proceedings of the IEEE International Test Conference, 2024

MBIST-based weak bit screening method for embedded MRAM.
Proceedings of the IEEE European Test Symposium, 2024

2023
Transitioning eMRAM from Pilot Project to Volume Production.
Proceedings of the IEEE International Test Conference, 2023

Smart Hammering: A practical method of pinhole detection in MRAM memories.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022
MBIST-based Trim-Search Test Time Reduction for STT-MRAM.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM.
Proceedings of the 26th IEEE European Test Symposium, 2021

2020
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing.
Proceedings of the IEEE International Test Conference, 2020

MBIST Support for Reliable eMRAM Sensing.
Proceedings of the IEEE European Test Symposium, 2020


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