Jongkyun Kim

According to our database¹, Jongkyun Kim authored at least 5 papers between 2013 and 2021.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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Bibliography

2021

Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2019

Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Effect of DC/AC stress on the reliability of cell capacitor in DRAM.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

Effect of OFF-state stress on reliability of nMOSFET in SWD circuits of DRAM.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

2013

A small-sized class-J power amplifier from combined multi-harmonic voltage reflection functions.

[BibT_eX]

[DOI]

Youngcheol Park

Jongkyun Kim

IEICE Electron. Express, 2013

Jongkyun Kim

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