Jonghyoung Lim

According to our database, Jonghyoung Lim authored at least 2 papers in 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.

Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang

Proceedings of the 2008 IEEE International Test Conference, 2008

A Prevenient Voltage Stress Test Method for High Density Memory.

Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008