Jone F. Chen

According to our database1, Jone F. Chen authored at least 4 papers between 1998 and 2009.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2009
Effect of NDD dosage on hot-carrier reliability in DMOS transistors.
Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

1999
Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates.
IEEE J. Solid State Circuits, 1999

1998
Design in hot-carrier reliability for high performance logic applications.
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998

Performance and reliability of asymmetric LDD devices and logic gates.
Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998


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