Jonathan Tobias Reif

According to our database, Jonathan Tobias Reif authored at least 8 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2024

Semantic Capability Model for the Simulation of Manufacturing Processes.

Jonathan Tobias Reif, Tom Jeleniewski, Aljosha Köcher, Tim Frerich, Felix Gehlhoff, Alexander Fay

Proceedings of the 16th International Joint Conference on Knowledge Discovery, 2024

Chatbot-Based Ontology Interaction Using Large Language Models and Domain-Specific Standards.

Jonathan Tobias Reif, Tom Jeleniewski, Milapji Singh Gill, Felix Gehlhoff, Alexander Fay

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

Parameter Interdependencies in Knowledge Graphs for Manufacturing Processes.

Tom Jeleniewski, Jonathan Tobias Reif, Felix Gehlhoff, Alexander Fay

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

2023

Systematic Comparison of Software Agents and Digital Twins: Differences, Similarities, and Synergies in Industrial Production: A Dataset.

Lasse Matthias Reinpold, Lukas Peter Wagner, Felix Gehlhoff, Malte Ramonat, Maximilian Kilthau, Milapji Singh Gill, Jonathan Tobias Reif, Vincent Henkel, Lena Scholz, Alexander Fay

Dataset, July, 2023

Systematic Comparison of Software Agents and Digital Twins: Differences, Similarities, and Synergies in Industrial Production.

Lasse Matthias Reinpold, Lukas P. Wagner, Felix Gehlhoff, Malte Ramonat, Maximilian Kilthau, Milapji Singh Gill, Jonathan Tobias Reif, Vincent Henkel, Lena Scholz, Alexander Fay

CoRR, 2023

A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing.

Tom Jeleniewski, Hamied Nabizada, Jonathan Tobias Reif, Aljosha Köcher, Alexander Fay

Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023

An Approach to Automating the Generation of Process Simulation Sequences.

Jonathan Tobias Reif, Tom Jeleniewski, Alexander Fay

Proceedings of the 28th IEEE International Conference on Emerging Technologies and Factory Automation, 2023

Integrating Interdependencies in Semantic Manufacturing Process Description Models.

Tom Jeleniewski, Jonathan Tobias Reif, Alexander Fay

Proceedings of the 28th IEEE International Conference on Emerging Technologies and Factory Automation, 2023