Jonathan T.-Y. Chang

According to our database, Jonathan T.-Y. Chang authored at least 6 papers between 1996 and 1998.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

1998

Experimental Results for IDDQ and VLV Testing.

Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.

Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Detecting resistive shorts for CMOS domino circuits.

Jonathan T.-Y. Chang, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

SHOrt voltage elevation (SHOVE) test for weak CMOS ICs.

Jonathan T.-Y. Chang, Edward J. McCluskey

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1996

Quantitative analysis of very-low-voltage testing.

Jonathan T.-Y. Chang, Edward J. McCluskey

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Detecting Delay Flaws by Very-Low-Voltage Testing.

Jonathan T.-Y. Chang, Edward J. McCluskey

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996