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Jon C. Lee

Affiliations:
  • Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, Taiwan


According to our database1, Jon C. Lee authored at least 4 papers between 2001 and 2009.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2009
A study of electrical characteristic changes in MOSFET by electron beam irradiation.
[BibTeX]
[DOI]
Yasuhiro Mitsui
,
Takeshi Sunaoshi
,
Jon C. Lee
Microelectron. Reliab., 2009

2003
A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis.
[BibTeX]
[DOI]
Jon C. Lee
,
J. H. Chuang
Microelectron. Reliab., 2003

2002
Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation.
[BibTeX]
[DOI]
Jon C. Lee
,
C. H. Chen
,
David Su
,
J. H. Chuang
Microelectron. Reliab., 2002

2001
A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis.
[BibTeX]
[DOI]
Jon C. Lee
,
David Su
,
J. H. Chuang
Microelectron. Reliab., 2001


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