John Sylvestri
According to our database1,
John Sylvestri
authored at least 3 papers
between 2008 and 2016.
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Bibliography
2016
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
2009
On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC).
Proceedings of the 2009 IEEE International Test Conference, 2009
2008
Proceedings of the 2008 IEEE International Test Conference, 2008