John M. Carulli Jr.
According to our database1,
John M. Carulli Jr.
authored at least 39 papers
between 2004 and 2024.
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2024
IEEE Des. Test, 2024
Proceedings of the IEEE International Test Conference, 2024
2017
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017
Systematic defect detection methodology for volume diagnosis: A data mining perspective.
Proceedings of the IEEE International Test Conference, 2017
2016
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Proceedings of the 2016 IEEE International Test Conference, 2016
Variation and failure characterization through pattern classification of test data from multiple test stages.
Proceedings of the 2016 IEEE International Test Conference, 2016
2015
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.
IEEE Des. Test, 2015
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015
2014
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.
Proc. IEEE, 2014
ACM J. Emerg. Technol. Comput. Syst., 2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.
Proceedings of the 2014 International Test Conference, 2014
Proceedings of the 2014 International Test Conference, 2014
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.
Proceedings of the 2014 International Test Conference, 2014
Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014
2013
Predicting die-level process variations from wafer test data for analog devices: A feasibility study.
Proceedings of the 14th Latin American Test Workshop, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry.
Proceedings of the 2013 IEEE International Test Conference, 2013
Test data analytics - Exploring spatial and test-item correlations in production test data.
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the International Symposium on Quality Electronic Design, 2013
Proceedings of the 18th IEEE European Test Symposium, 2013
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.
Proceedings of the Design, Automation and Test in Europe, 2013
2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012
2011
Proceedings of the 2011 IEEE International Test Conference, 2011
2010
Proceedings of the Design, Automation and Test in Europe, 2010
2009
Proceedings of the 27th International Conference on Computer Design, 2009
2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2006
IEEE Des. Test Comput., 2006
2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004