John Dunklee

According to our database, John Dunklee authored at least 1 paper in 2015.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2015

Wafer-level electromigration for reliability monitoring: Quick-turn electromigration stress with correlation to package-level stress.

D. Slottke, R. J. Kamaladasa, M. Harmes, Ilan Tsameret, Mauro J. Kobrinsky, Timothy McMullen, John Dunklee

Proceedings of the IEEE International Reliability Physics Symposium, 2015