John C. Koob

According to our database, John C. Koob authored at least 7 papers between 2001 and 2011.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2011

Design and Characterization of a Multilevel DRAM.

John C. Koob, Sue Ann Ung, Bruce F. Cockburn, Duncan G. Elliott

IEEE Trans. Very Large Scale Integr. Syst., 2011

2009

A Compact 1.1-Gb/s Encoder and a Memory-Based 600-Mb/s Decoder for LDPC Convolutional Codes.

Tyler L. Brandon, John C. Koob, Leendert van den Berg, Zhengang Chen, Amirhossein Alimohammad, Ramkrishna Swamy, Jason Klaus, Stephen Bates, Vincent C. Gaudet, Bruce F. Cockburn, Duncan G. Elliott

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

2008

A 600-Mb/s encoder and decoder for low-density parity-check convolutional codes.

Tyler L. Brandon, John C. Koob, Leendert van den Berg, Zhengang Chen, Amirhossein Alimohammad, Ramkrishna Swamy, Jason Klaus, Stephen Bates, Vincent C. Gaudet, Bruce F. Cockburn, Duncan G. Elliott

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

Design and Test of a 175-Mb/s, Rate-1/2 (128, 3, 6) Low-Density Parity-Check Convolutional Code Encoder and Decoder.

Ramkrishna Swamy, Stephen Bates, Tyler L. Brandon, Bruce F. Cockburn, Duncan G. Elliott, John C. Koob, Zhengang Chen

IEEE J. Solid State Circuits, 2007

2005

Design of a 3-D fully depleted SOI computational RAM.

John C. Koob, Daniel A. Leder, Raymond J. Sung, Tyler L. Brandon, Duncan G. Elliott, Bruce F. Cockburn, Lisa G. McIlrath

IEEE Trans. Very Large Scale Integr. Syst., 2005

Test and Characterization of a Variable-Capacity Multilevel DRAM.

John C. Koob, Sue Ann Ung, Ashwin S. Rao, Daniel A. Leder, Craig S. Joly, Kristopher C. Breen, Tyler L. Brandon, Michael Hume, Bruce F. Cockburn, Duncan G. Elliott

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

2001

Design of an Embedded Fully-Depleted SOI SRAM.

Raymond J. Sung, John C. Koob, Tyler L. Brandon, Duncan G. Elliott, Bruce F. Cockburn

Proceedings of the 9th IEEE International Workshop on Memory Technology, 2001