John Brockman

According to our database, John Brockman authored at least 4 papers between 1996 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.

Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.

Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2001

SIGDOC reminiscences.

John Brockman

ACM J. Comput. Documentation, 2001

1996

Where is the Xerox Corporation of the LIS Sector?

Alan Gilchrist, John Brockman

Libr. Trends, 1996