Johannes Svensson

According to our database, Johannes Svensson authored at least 2 papers between 2017 and 2018.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2018

Effect of Gate Oxide Defects on Tunnel Transistor RF Performance.

Markus Hellenbrand, Elvedin Memisevic, Johannes Svensson, A. Krishnaraja, Erik Lind, Lars-Erik Wernersson

Proceedings of the 76th Device Research Conference, 2018

2017

Random telegraph signal noise in tunneling field-effect transistors with S below 60 mV/decade.

Markus Hellenbrand, Elvedin Memisevic, Johannes Svensson, Erik Lind, Lars-Erik Wernersson

Proceedings of the 47th European Solid-State Device Research Conference, 2017