Joel Lurkins

According to our database, Joel Lurkins authored at least 2 papers between 2005 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers.

Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware

IEEE Des. Test Comput., 2006

2005

Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC.

Joel Lurkins, DeAnna Hill, Brady Benware

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005