Joe Swenton

According to our database, Joe Swenton authored at least 13 papers between 1998 and 2024.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of four.

2024

Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology.

Zhan Gao, Min-Chun Hu, Rogier Baert, Bilal Chehab, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen

IEEE Des. Test, 2024

2021

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality.

Zhan Gao, Min-Chun Hu, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Erik Jan Marinissen

J. Electron. Test., 2021

Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis.

Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults.

Min-Chun Hu, Zhan Gao, Santosh Malagi, Joe Swenton, Jos Huisken, Kees Goossens, Cheng-Wen Wu, Erik Jan Marinissen

Proceedings of the IEEE European Test Symposium, 2020

2019

Defect-Location Identification for Cell-Aware Test.

Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken, Kees Goossens

Proceedings of the IEEE Latin American Test Symposium, 2019

Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library.

Zhan Gao, Santosh Malagi, Min-Chun Hu, Joe Swenton, Rogier Baert, Jos Huisken, Bilal Chehab, Kees Goossens, Erik Jan Marinissen

Proceedings of the IEEE International Test Conference, 2019

Optimization of Cell-Aware ATPG Results by Manipulating Library Cells' Defect Detection Matrices.

Zhan Gao, Min-Chun Hu, Joe Swenton, Santosh Malagi, Jos Huisken, Kees Goossens, Erik Jan Marinissen

Proceedings of the IEEE International Test Conference in Asia, 2019

2018

Improving Diagnosis Resolution and Performance at High Compression Ratios.

Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula

Proceedings of the IEEE International Test Conference, 2018

2017

High throughput multiple device diagnosis system.

Sameer Chillarige, Anil Malik, Sharjinder Singh, Joe Swenton, Krishna Chakravadhanula

Proceedings of the IEEE International Test Conference, 2017

2015

A Novel Failure Diagnosis Approach for Low Pin Count and Low Power Compression Architectures.

Sameer Chillarige, S. Virdi, Anil Malik, Krishna Chakravadhanula, Vivek Chickermane, Joe Swenton, G. Vandling

Proceedings of the 24th IEEE North Atlantic Test Workshop, 2015

2000

Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count.

Robert Butler, Brion L. Keller, Sarala Paliwal, Richard Schoonover, Joseph Swenton

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor.

Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998

ATPG in practical and non-traditional applications.

Brion L. Keller, Kevin McCauley, Joseph Swenton, James Youngs

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998