Joachim C. Reiner

According to our database, Joachim C. Reiner authored at least 6 papers between 2001 and 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing.

Peter Jacob, Uwe Thiemann, Joachim C. Reiner

Microelectron. Reliab., 2005

2004

Gallium Artefacts on FIB-milled Silicon Samples.

Joachim C. Reiner, Philipp Nellen, Urs Sennhauser

Microelectron. Reliab., 2004

Electrostatic Effects on Semiconductor Tools.

Peter Jacob, Joachim C. Reiner

Microelectron. Reliab., 2004

2003

Pre-breakdown leakage current fluctuations of thin gate oxide.

Joachim C. Reiner

Microelectron. Reliab., 2003

2002

Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown.

Joachim C. Reiner, Philippe Gasser, Urs Sennhauser

Microelectron. Reliab., 2002

2001

Relevance of contact reliability in HBM-ESD test equipment.

Joachim C. Reiner, Thomas Keller

Microelectron. Reliab., 2001