Jize Jiang

According to our database, Jize Jiang authored at least 10 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

UOUO: Uncontextualized Uncommon Objects for Measuring Knowledge Horizons of Vision Language Models.

Xinyu Pi, Mingyuan Wu, Jize Jiang, Haozhen Zheng, Beitong Tian, ChengXiang Zhai, Klara Nahrstedt, Zhiting Hu

Proceedings of the 2024 Conference on Empirical Methods in Natural Language Processing, 2024

2023

Efficient Title Reranker for Fast and Improved Knowledge-Intense NLP.

Ziyi Chen, Heyi Tao, Daqian Zuo, Jize Jiang, Jun Yang, Yuxiang Wei

CoRR, 2023

Competence-Based Analysis of Language Models.

Adam Davies, Jize Jiang, ChengXiang Zhai

CoRR, 2023

2018

A 65-nm CMOS Low Dropout Regulator Featuring >60-dB PSRR Over 10-MHz Frequency Range and 100-mA Load Current Range.

Jize Jiang, Wei Shu, Joseph S. Chang

IEEE J. Solid State Circuits, 2018

Radiation Hardening By Design Integrated Circuits Enabling Low-Cost Satellites for Internet-of-Things.

Wei Shu, Jize Jiang, Kwen-Siong Chong, Joseph Sylvester Chang

Proceedings of the 23rd IEEE International Conference on Digital Signal Processing, 2018

2017

A 5.6 ppm/°C Temperature Coefficient, 87-dB PSRR, Sub-1-V Voltage Reference in 65-nm CMOS Exploiting the Zero-Temperature-Coefficient Point.

Jize Jiang, Wei Shu, Joseph S. Chang

IEEE J. Solid State Circuits, 2017

2016

Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process.

Tong Lin, Kwen-Siong Chong, Wei Shu, Ne Kyaw Zwa Lwin, Jize Jiang, Joseph S. Chang

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS process.

Jize Jiang, Wei Shu, Kwen-Siong Chong, Tong Lin, Ne Kyaw Zwa Lwin, Joseph Sylvester Chang, Jingyuan Liu

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

A novel subthreshold voltage reference featuring 17ppm/°C TC within -40°C to 125°C and 75dB PSRR.

Jize Jiang, Wei Shu, Joseph Sylvester Chang, Jingyuan Liu

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2014

Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process.

Joseph S. Chang, Kwen-Siong Chong, Wei Shu, Tong Lin, Jize Jiang, Ne Kyaw Zwa Lwin, Yang Kang

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014