Jiuqi Li

According to our database, Jiuqi Li authored at least 2 papers between 2024 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Highly Defect Detectable and SEU-Resilient Robust Scan-Test-Aware Latch Design.

Ruijun Ma, Stefan Holst, Hui Xu, Xiaoqing Wen, Senling Wang, Jiuqi Li, Aibin Yan

IEEE Trans. Very Large Scale Integr. Syst., February, 2025

2024

A cost-effective and highly robust triple-node-upset self-recoverable latch design based on dual-output C-elements.

Hui Xu, Lin Tang, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Jiuqi Li, Xiaodong Ai

Microelectron. J., 2024