Jitendra Khare

According to our database, Jitendra Khare authored at least 20 papers between 1992 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

Embedded Memory Field Returns - Trials and Tribulations.

Jitendra Khare, Amit B. Shah, Ashok Raman, Girish Rayas

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

Memory Yield Improvement - SoC Design Perspective.

Jitendra Khare

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Test Strategies For a 40Gbps Framer SoC.

Hans T. Heineken, Jitendra Khare

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

DFM - A Fabless Perspective.

Jitendra Khare

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2001

Enabling Embedded Memory Diagnosis via Test Response Compression.

John T. Chen, Wojciech Maly, Janusz Rajski, Omar Kebichi, Jitendra Khare

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring.

John T. Chen, Jitendra Khare, Ken Walker, Saghir A. Shaikh, Janusz Rajski, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Test and Debug of Networking SoCs: A Case Study.

A. Bommireddy, Jitendra Khare, Saghir A. Shaikh, S.-T. Su

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Manufacturability and Testability Oriented Synthesis.

Saghir A. Shaikh, Jitendra Khare, Hans T. Heineken

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

Maximizing Wafer Productivity Through Layout Optimization.

Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, Saghir A. Shaikh, Manuel d'Abreu

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

Cost Trade-Offs in System On Chip Designs.

Jitendra Khare, Hans T. Heineken, Manuel d'Abreu

Proceedings of the 13th International Conference on VLSI Design (VLSI Design 2000), 2000

1998

Design-Manufacturing Interface: Part II - Applications.

Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Hans T. Heineken, Jitendra Khare, P. Simon

Proceedings of the 1998 Design, 1998

Design-Manufacturing Interface: Part I - Vision.

Wojciech Maly, Pranab K. Nag, Hans T. Heineken, Jitendra Khare

Proceedings of the 1998 Design, 1998

Manufacturability analysis of standard cell libraries.

Hans T. Heineken, Jitendra Khare, Manuel d'Abreu

Proceedings of the IEEE 1998 Custom Integrated Circuits Conference, 1998

1997

CAD at the Design-Manufacturing Interface.

Hans T. Heineken, Jitendra Khare, Wojciech Maly, Pranab K. Nag, Charles H. Ouyang, Witold A. Pleskacz

Proceedings of the 34st Conference on Design Automation, 1997

1996

Fault characterization of standard cell libraries using inductive contamination.

Jitendra Khare, Wojciech Maly, Nathan Tiday

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Design for manufacturability in submicron domain.

Wojciech Maly, Hans T. Heineken, Jitendra Khare, Pranab K. Nag

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

1995

Testability-oriented channel routing.

Jitendra Khare, Sujoy Mitra, Pranab K. Nag, U. Maly, Rob A. Rutenbar

Proceedings of the 8th International Conference on VLSI Design (VLSI Design 1995), 1995

Inductive Contamination Analysis (ICA) with SRAM Application.

Jitendra Khare, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1993

Estimation of reject ratio in testing of combinatorial circuits.

Dinesh D. Gaitonde, Jitendra Khare, D. M. H. Walker, Wojciech P. Maly

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

1992

Design for testability view on placement and routing.

Derek Feltham, Jitendra Khare, Wojciech Maly

Proceedings of the conference on European design automation, 1992