Jishun Kuang

According to our database, Jishun Kuang authored at least 34 papers between 2003 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

The design of ΔΣ-ADC in MEMS gyro interface ASIC.

Jinhui Tan, Jishun Kuang, Xing Hu, Xiaomin Cai, Jiahe Shi

Microelectron. J., April, 2023

2022

Small-Signal Processing Low-Overhead Operational Amplifier for delta-Sigma ADC.

Jinhui Tan, Jishun Kuang, Xing Hu, Lin Xiao

J. Circuits Syst. Comput., 2022

2021

Improving Compression Ratios for Code-Based Test Pattern Compressions through Column-Wise Reordering Algorithms.

Minghe Zhang, Jishun Kuang, Jing Huang, Renfa Li

J. Circuits Syst. Comput., 2021

2019

LPCMsim: A Lightweight Phase Change Memory Simulator.

Zaihong He, Jishun Kuang, Yanjie Tan, Shihui Peng, Huailiang Tan

Future Gener. Comput. Syst., 2019

A Pseudo-Random Transform Decomposition Method for Improving the Coding Compression Ratio of Test Data.

Minghe Zhang, Jishun Kuang, Jing Huang, Zhiqiang You

Proceedings of the 21st IEEE International Conference on High Performance Computing and Communications; 17th IEEE International Conference on Smart City; 5th IEEE International Conference on Data Science and Systems, 2019

Design and Implementation of GPU Accelerated Active Storage in FastDFS.

Zaihong He, Jishun Kuang, Yanjie Tan, Wenjie Liu, Bin Sheng

Proceedings of the 21st IEEE International Conference on High Performance Computing and Communications; 17th IEEE International Conference on Smart City; 5th IEEE International Conference on Data Science and Systems, 2019

2018

A novel memristor-based restricted Boltzmann machine for contrastive divergence.

Yan Chen, Zhiqiang You, Yingjie Zhang, Jishun Kuang, Jing Zhang

IEICE Electron. Express, 2018

2016

Representative Scan Architecture.

Ling Zhang, Jishun Kuang

J. Circuits Syst. Comput., 2016

A parallel-SSHI rectifier for ultra-low-voltage piezoelectric vibration energy harvesting.

Liao Wu, Jishun Kuang, Zhiqiang You, Peng Liu, Shuo Cai

IEICE Electron. Express, 2016

A sort method to enhance significant spectral components of test set.

Yingbo Zhou, Jishun Kuang

Proceedings of the 12th International Conference on Natural Computation, 2016

2015

An efficient small-delay faults simulator based on critical path tracing.

Tieqiao Liu, Jishun Kuang, Shuo Cai, Zhiqiang You

Int. J. Circuit Theory Appl., 2015

Logic operation-based DFT method and 1R memristive crossbar March-like test algorithm.

Peng Liu, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Weizheng Wang

IEICE Electron. Express, 2015

An active rectifier with optimal flip timing for the internal capacitor for piezoelectric vibration energy harvesting.

Liao Wu, Dong Sam Ha, Jishun Kuang, Xuan-Dien Do, Sang-Gug Lee

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

Improve the compression ratios for code-based test vector compressions by decomposing.

Jishun Kuang, Liang Zhang, Zhiqiang You, Yingbo Zhou

Proceedings of the 20th IEEE European Test Symposium, 2015

2014

An adaptive neural network A/D converter based on CMOS/memristor hybrid design.

Weiwei Wang, Zhiqiang You, Peng Liu, Jishun Kuang

IEICE Electron. Express, 2014

2013

Comparator and half adder design using complementary resistive switches crossbar.

Bosheng Liu, Zhiqiang You, Xiangrao Li, Jishun Kuang, Zheng Qin

IEICE Electron. Express, 2013

2012

Achieving low capture and shift power in linear decompressor-based test compression environment.

Weizheng Wang, Jishun Kuang, Zhiqiang You

Microelectron. J., 2012

Virtual scan chains reordering using a RAM-based module for high test compression.

Ling Zhang, Jishun Kuang, Zhiqiang You

Microelectron. J., 2012

A scan disabling-based BAST scheme for test cost and test power reduction.

Zhiqiang You, Weizheng Wang, Peng Liu, Jishun Kuang, Zheng Qin

IEICE Electron. Express, 2012

Switching activity reduction for scan-based BIST using weighted scan input data.

Weizheng Wang, Jishun Kuang, Peng Liu, Xin Peng, Zhiqiang You

IEICE Electron. Express, 2012

2011

Test data compression using interval broadcast scan for embedded cores.

Ling Zhang, Jishun Kuang, Zhiqiang You

Microelectron. J., 2011

A New Test Data Compression Scheme.

Ling Zhang, Jishun Kuang

J. Comput., 2011

A scan disabling-based BAST scheme for test cost reduction.

Zhiqiang You, Weizheng Wang, Zhiping Dou, Peng Liu, Jishun Kuang

IEICE Electron. Express, 2011

Test Data Compression Using Selective Sparse Storage.

Ling Zhang, Jishun Kuang, Zhiqiang You

J. Electron. Test., 2011

2010

Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core.

Ling Zhang, Jishun Kuang, Zhiqiang You

Proceedings of the Algorithms and Architectures for Parallel Processing, 2010

Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power.

Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Small Delay Fault Simulation for Sequential Circuits.

Li Liu, Jishun Kuang, Huawei Li

Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009

2008

Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction.

Yong-sheng Cheng, Zhiqiang You, Jishun Kuang

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008

A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself.

Jishun Kuang, Ouyang Xiong, Zhiqiang You

Proceedings of the 17th IEEE Asian Test Symposium, 2008

DCScan: A Power-Aware Scan Testing Architecture.

Gui Dai, Zhiqiang You, Jishun Kuang, Jiedi Huang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2005

A New BIST Solution for System-on-Chip.

Ling Zhang, Jishun Kuang

Proceedings of the 11th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2005), 2005

2003

IDDT: Fundamentals and Test Generation.

Jishun Kuang, Zhiqiang Yang, Qijian Zhu, Yinghua Min

J. Comput. Sci. Technol., 2003

At-Speed Current Testing.

Yinghua Min, Jishun Kuang, Xiaoyan Niu

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

IDDT ATPG Based on Ambiguous Delay Assignments.

Jishun Kuang, Yu Wang, Xiaofen Wei, Changnian Zhang

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003