Jiri Nosek

According to our database, Jiri Nosek authored at least 4 papers between 2000 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor.

Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa

J. Electron. Test., 2004

2001

Test-per-Clock Testing of the Circuits with Scan.

Ondrej Novák, Jiri Nosek

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

Test Pattern Decompression Using a Scan Chain.

Ondrej Novák, Jiri Nosek

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

On Using Deterministic Test Sets in BIST.

Ondrej Novák, Jiri Nosek

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000