Jing Zhuge

According to our database, Jing Zhuge authored at least 2 papers in 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors.

Ru Huang, Runsheng Wang, Changze Liu, Liangliang Zhang, Jing Zhuge, Yu Tao, Jinbin Zou, Yuchao Liu, Yangyuan Wang

Microelectron. Reliab., 2011

Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling.

Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, Liangliang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011