Jing Li
Orcid: 0000-0001-9980-0224Affiliations:
- University of Electronic Science and Technology of China, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu, China (PhD 2014)
According to our database1,
Jing Li
authored at least 37 papers
between 2014 and 2024.
Collaborative distances:
Collaborative distances:
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on orcid.org
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Bibliography
2024
An Adaptive Common-Mode Cancellation Biopotential Amplifier for Two-Electrode Dynamic ECG Recording.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2024
2023
A 3-5 GHz, 108fs-RMS jitter, clock receiver circuit for time-interleaved ADCs with a sampling rate of 4 GS/s.
Microelectron. J., September, 2023
A 20 nW +0.8°C/-0.8°C Inaccuracy (3σ) Leakage-Based CMOS Temperature Sensor With Supply Sensitivity of 0.9°C/V.
IEEE Trans. Circuits Syst. I Regul. Pap., 2023
A programmable analog front-end with independent biasing technique for ECG signal acquisition.
Microelectron. J., 2023
Proceedings of the 15th IEEE International Conference on ASIC, 2023
Proceedings of the 15th IEEE International Conference on ASIC, 2023
A Programmable High-Voltage Pulse Transmitter Circuit for 3-D Miniature Ultrasound Probes.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2022
A Code-Recombination Algorithm-Based ADC With Feature Extraction for WBSN Applications.
IEEE Trans. Very Large Scale Integr. Syst., 2022
A 12-Bit Two-Step Single-Slope ADC With a Constant Input-Common-Mode Level Resistor Ramp Generator.
IEEE Trans. Very Large Scale Integr. Syst., 2022
A 12bit 250 MS/s 5.43fJ/conversion-step SAR ADC with adaptive asynchronous logic in 28 nm CMOS.
Microelectron. J., 2022
A 13-Bit ENOB Third-Order Noise-Shaping SAR ADC Employing Hybrid Error Control Structure and LMS-Based Foreground Digital Calibration.
IEEE J. Solid State Circuits, 2022
2021
A Second-Order Noise-Shaping SAR ADC Using Two Passive Integrators Separated by the Comparator.
IEEE Trans. Very Large Scale Integr. Syst., 2021
A +0.44°C/-0.4°C Inaccuracy Temperature Sensor With Multi-Threshold MOSFET-Based Sensing Element and CMOS Thyristor-Based VCO.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
Proceedings of the IEEE Custom Integrated Circuits Conference, 2021
A Second-Order Passive Noise-Shaping SAR ADC Using the LMS-Based Mismatch Calibration.
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
IEEE Trans. Circuits Syst. I Regul. Pap., 2020
IEEE Trans. Circuits Syst., 2020
A Low Voltage and Low Power 10-bit Non-Binary 2b/Cycle Time and Voltage Based SAR ADC.
IEEE Trans. Circuits Syst. I Fundam. Theory Appl., 2020
A second-order noise-shaping SAR ADC with error-feedback structure and data weighted averaging.
Microelectron. J., 2020
Switching sequence optimization for gradient errors compensation in the current-steering DAC design.
Microelectron. J., 2020
Microelectron. J., 2020
Biomed. Signal Process. Control., 2020
A 12-Bit Column-Parallel Two-Step Single-Slope ADC With a Foreground Calibration for CMOS Image Sensors.
IEEE Access, 2020
A 10-Bit Fully-Predictive ADC with Code-Recombination Algorithm in Transducing Sensor Node Signals.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
2019
Microelectron. J., 2019
A Bandwidth Mismatch Optimization Technique in Time-Interleaved Analog-to-Digital Converters.
J. Circuits Syst. Comput., 2019
J. Circuits Syst. Comput., 2019
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
IEEE Trans. Very Large Scale Integr. Syst., 2018
IEEE Access, 2018
IEEE Access, 2018
Proceedings of the 2018 IEEE Asia Pacific Conference on Circuits and Systems, 2018
2014
IEEE Trans. Circuits Syst. II Express Briefs, 2014
Multiscaling coefficients Technique for gain error Background Calibration in Pipelined ADC.
J. Circuits Syst. Comput., 2014
J. Circuits Syst. Comput., 2014