Jinda Yan

According to our database, Jinda Yan authored at least 3 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Multi-scale guidance diffusion network for wafer map defect recognition.

Zuxiang Long, Jinda Yan, Minghao Piao

Expert Syst. Appl., 2025

2024

Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification.

Minghao Piao, Yi Sheng, Jinda Yan, Cheng Hao Jin

ACM Trans. Knowl. Discov. Data, May, 2024

2023

Semantic Segmentation-Based Wafer Map Mixed-Type Defect Pattern Recognition.

Jinda Yan, Yi Sheng, Minghao Piao

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023