Jinchul Park

According to our database1, Jinchul Park authored at least 1 paper in 2015.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2015
Effects of front-end-of line process variations and defects on retention failure of flash memory: Charge loss/gain mechanism.
Proceedings of the IEEE International Reliability Physics Symposium, 2015


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