Jin-Woo Han

Orcid: 0000-0002-5118-1310

According to our database¹, Jin-Woo Han authored at least 18 papers between 2010 and 2024.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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In proceedings

Article

PhD thesis

Dataset

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Links

On csauthors.net:

Bibliography

2024

Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell.

[BibT_eX]

[DOI]

IEEE Access, 2024

Cell to Core-Periphery Overlap (C2O) Based on BCAT for Next Generation DRAM.

[BibT_eX]

[DOI]

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects.

[BibT_eX]

[DOI]

IEEE Access, 2023

Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation.

[BibT_eX]

[DOI]

IEEE Access, 2023

Radiation-Hardened Processing-In-Memory Crossbar Array With Hybrid Synapse Devices for Space Application.

[BibT_eX]

[DOI]

Shin-Uk Kang

Jin-Woo Han

Min-Seong Choo

Proceedings of the International Conference on Electronics, Information, and Communication, 2023

2022

Energy- and Area-Efficient CMOS Synapse and Neuron for Spiking Neural Networks With STDP Learning.

[BibT_eX]

[DOI]

Bomin Joo

Jin-Woo Han

Bai-Sun Kong

IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Evolutionary Learning of Binary Neural Network Using a TaOx Memristor via Stochastic Stateful Logic.

[BibT_eX]

[DOI]

Adv. Intell. Syst., 2022

2021

Surface Potential-Controlled Oscillation in FET-Based Biosensors.

[BibT_eX]

[DOI]

Sensors, 2021

A Unified Method for Deinterleaving and PRI Modulation Recognition of Radar Pulses Based on Deep Neural Networks.

[BibT_eX]

[DOI]

Jin-Woo Han

Cheong Hee Park

IEEE Access, 2021

Single Event Hard Error due to Terrestrial Radiation.

[BibT_eX]

[DOI]

Jin-Woo Han

M. Meyyappan

Jungsik Kim

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Electron Emission Devices for Energy-Efficient Systems.

[BibT_eX]

[DOI]

Adv. Intell. Syst., 2019

2018

A 28mn FD-SOI 4KB Radiation-hardened 12T SRAM Macro with 0.6 ~ 1V Wide Dynamic Voltage Scaling for Space Applications.

[BibT_eX]

[DOI]

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2018

2016

A CMOS-compatible boosted transistor having >2× drive current and low leakage current.

[BibT_eX]

[DOI]

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015

Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

2014

Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2014

Emitter location based on the linearization of quadratic TDOA and FDOA curves.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Electronics, Information and Communications, 2014

2010

Pulse Repetition Interval Modulation Recognition Using Symbolization.

[BibT_eX]

[DOI]

Proceedings of the International Conference on Digital Image Computing: Techniques and Applications, 2010

Jin-Woo Han

Timeline

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