Jin-Su Shin

Orcid: 0009-0003-9871-0317

According to our database1, Jin-Su Shin authored at least 3 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Bibliography

2025
A framework for detecting unknown defect patterns on wafer bin maps using active learning.
Expert Syst. Appl., 2025

2024
Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns.
Comput. Ind. Eng., 2024

A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map.
Proceedings of the Industrial Engineering and Applications - Europe, 2024


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