Jin-Su Shin
Orcid: 0009-0003-9871-0317
According to our database1,
Jin-Su Shin
authored at least 3 papers
between 2024 and 2025.
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Bibliography
2025
A framework for detecting unknown defect patterns on wafer bin maps using active learning.
Expert Syst. Appl., 2025
2024
Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns.
Comput. Ind. Eng., 2024
Proceedings of the Industrial Engineering and Applications - Europe, 2024