Jin-Ping Han

According to our database, Jin-Ping Han authored at least 4 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited).

Martin M. Frank, Ning Li, Malte J. Rasch, Shubham Jain, Ching-Tzu Chen, Ramachandran Muralidhar, Jin-Ping Han, Vijay Narayanan, Timothy Philip, Kevin Brew, Andrew Simon, Iqbal Saraf, Nicole Saulnier, Irem Boybat, Stanislaw Wozniak, Abu Sebastian, Pritish Narayanan, Charles Mackin, An Chen, Hsinyu Tsai, Geoffrey W. Burr

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Impact of Phase-Change Memory Flicker Noise and Weight Drift on Analog Hardware Inference for Large-Scale Deep Learning Networks.

Jin-Ping Han, Malte J. Rasch, Zuoguang Liu, Paul Solomon, Kevin Brew, Kangguo Cheng, Injo Ok, Victor Chan, Michael Longstreet, Wanki Kim, Robert L. Bruce, Cheng-Wei Cheng, Nicole Saulnier, Vijay Narayanan

Adv. Intell. Syst., 2022

2021

Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation.

Robert L. Bruce, Syed Ghazi Sarwat, Irem Boybat, Cheng-Wei Cheng, Wanki Kim, S. R. Nandakumar, Charles Mackin, Timothy Philip, Zuoguang Liu, Kevin Brew, Nanbo Gong, Injo Ok, Praneet Adusumilli, Katie Spoon, Stefano Ambrogio, Benedikt Kersting, Thomas Bohnstingl, Manuel Le Gallo, Andrew Simon, Ning Li, Iqbal Saraf, Jin-Ping Han, Lynne M. Gignac, John M. Papalia, Tenko Yamashita, Nicole Saulnier, Geoffrey W. Burr, Hsinyu Tsai, Abu Sebastian, Vijay Narayanan, Matthew BrightSky

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2005

Reverse short channel effects in high-k gated nMOSFETs.

Jin-Ping Han, Sang-Mo Koo, Eric M. Vogel, Evgeni P. Gusev, C. D'Emic, Curt A. Richter, John S. Suehle

Microelectron. Reliab., 2005