Jihun Jung

According to our database, Jihun Jung authored at least 12 papers between 2008 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience.

Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park

IEEE Access, 2020

2018

Erratum to "Time-Multiplexed-Network for Test Cost Reduction".

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Time-Multiplexed 1687-Network for Test Cost Reduction.

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Framework for Evaluating Vision-based Autonomous Steering Control Model.

Soon Kwon, Jaehyeong Park, Heechul Jung, Jihun Jung, Min-Kook Choi, Iman Rahmansyah Tayibnapis, Jin-Hee Lee, Woong-Jae Won, Sung-Hoon Youn, Kwang-Hoe Kim, Tae Hun Kim

Proceedings of the 21st International Conference on Intelligent Transportation Systems, 2018

Co-Occurrence Matrix Analysis-Based Semi-Supervised Training for Object Detection.

Min-Kook Choi, Jaehyeong Park, Jihun Jung, Heechul Jung, Jin-Hee Lee, Woong-Jae Won, Woo Young Jung, Jincheol Kim, Soon Kwon

Proceedings of the 2018 IEEE International Conference on Image Processing, 2018

2017

On Diagnosing the Aging Level of Automotive Semiconductor Devices.

Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2017

ResNet-Based Vehicle Classification and Localization in Traffic Surveillance Systems.

Heechul Jung, Min-Kook Choi, Jihun Jung, Jin-Hee Lee, Soon Kwon, Woo Young Jung

Proceedings of the 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2017

2016

Time-multiplexed test access architecture for stacked integrated circuits.

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

IEICE Electron. Express, 2016

2015

Efficient diagnosis technique for aging defects on automotive semiconductor chips.

Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park

Proceedings of the 20th IEEE European Test Symposium, 2015

Scan-Puf: Puf Elements Selection Methods for Viable IC Identification.

Dooyoung Kim, Muhammad Adil Ansari, Jihun Jung, Sungju Park

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2011

Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate.

Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2008

Load Matrix Optimization in Mobile Cellular Networks.

Jihun Jung, Mohammad Abaii, Rahim Tafazolli

Proceedings of the 67th IEEE Vehicular Technology Conference, 2008