Jiezhi Chen

According to our database, Jiezhi Chen authored at least 30 papers between 2011 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Operation Scheme Optimizations to Achieve Ultra-high Endurance (1010) in Flash Memory with Robust Reliabilities.

Yang Feng, Zhaohui Sun, Chengcheng Wang, Xinyi Guo, Junyao Mei, Yueran Qi, Jing Liu, Junyu Zhang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen

CoRR, 2024

Unveiling Cryogenic Performance (4 to 300 K) Towards Ultra-Thin Ferroelectric HZO: Novel Kinetic Barrier Engineering and Underlying Mechanism.

Dong Zhang, Yang Feng, Zijie Zheng, Chen Sun, Qiwen Kong, Gan Liu, Zuopu Zhou, Gengchiau Liang, Kai Ni, Jixuan Wu, Jiezhi Chen, Xiao Gong

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

First Demonstration of BEOL-Compatible 3D Vertical FeNOR.

Yang Feng, Dong Zhang, Chen Sun, Zijie Zheng, Yue Chen, Qiwen Kong, Gan Liu, Yuye Kang, Kaizhen Han, Zuopu Zhou, Gengchiau Liang, Kai Ni, Jixuan Wu, Jiezhi Chen, Xiao Gong

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Near-threshold-voltage operation in flash-based high-precision computing-in-memory to implement Poisson image editing.

Yang Feng, Bing Chen, Mingfeng Tang, Yuerang Qi, Maoying Bai, Chengcheng Wang, Hai Wang, Xuepeng Zhan, Junyu Zhang, Jing Liu, Jixuan Wu, Jiezhi Chen

Sci. China Inf. Sci., December, 2023

High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage.

Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

Dual-pulse disturb-free programming scheme for FeFET based neuromorphic computing.

Shuhao Wu, Bo Chen, Chengcheng Wang, Junyao Mei, Maoying Bai, Xuepeng Zhan, Jixuan Wu, Junshuai Chai, Hao Xu, Xiaolei Wang, Jiezhi Chen

Microelectron. J., 2023

Grain Size Reduction of Ferroelectric HZO Enabled by a Novel Solid Phase Epitaxy (SPE) Approach: Working Principle, Experimental Demonstration, and Theoretical Understanding.

Dong Zhang, Jixuan Wu, Qiwen Kong, Zuopu Zhou, Long Liu, Kaizhen Han, Chen Sun, Xiaolin Wang, Gan Liu, Leming Jiao, Zijie Zheng, Yuye Kang, Jiezhi Chen, Xiao Gong

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme.

Xiaohuan Zhao, Shaoqi Yang, Kenie Xie, Yang Feng, Qianwen Wang, Pengpeng Sang, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen

Proceedings of the IEEE International Conference on Integrated Circuits, 2023

Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic Layer Deposition.

Junyao Mei, Bo Chen, Pengpeng Sang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen

Proceedings of the IEEE International Conference on Integrated Circuits, 2023

Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD.

Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen

Proceedings of the IEEE International Conference on Integrated Circuits, 2023

One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash.

Shaoqi Yang, Xiaohuan Zhao, Kenie Xie, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen

Proceedings of the 15th IEEE International Conference on ASIC, 2023

Flash-based Computing-in-memory Architectures with High-accuracy and Robust Reliabilities for General-purpose Applications.

Yang Feng, Yueran Qi, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen

Proceedings of the 15th IEEE International Conference on ASIC, 2023

2022

Experimentally-Validated Crossbar Model for Defect-Aware Training of Neural Networks.

Ruibin Mao, Bo Wen, Mingrui Jiang, Jiezhi Chen, Can Li

IEEE Trans. Circuits Syst. II Express Briefs, 2022

Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory.

Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang, Fei Wu, Jiezhi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Spatiotemporal Pattern Analysis of Land Use Functions in Contiguous Coastal Cities Based on Long-Term Time Series Remote Sensing Data: A Case Study of Bohai Sea Region, China.

Yuxuan Ye, Yafei Wang, Jinfeng Liao, Jiezhi Chen, Yangfan Zou, Yuan Liu, Chunye Feng

Remote. Sens., 2022

Long Time-Series Mapping and Change Detection of Coastal Zone Land Use Based on Google Earth Engine and Multi-Source Data Fusion.

Dong Chen, Yafei Wang, Zhenyu Shen, Jinfeng Liao, Jiezhi Chen, Shaobo Sun

Remote. Sens., 2022

Voltage and temperature dependence of Random Telegraph Noise and their impacts on random number generator.

Mingtao Xu, Bo Chen, Qi Jin, Lu Tai, Xuepeng Zhan, Jiezhi Chen

Microelectron. J., 2022

Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors.

Xuepeng Zhan, Jiezhi Chen, Zhigang Ji

Sci. China Inf. Sci., 2022

Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash.

Kenie Xie, Pena Guo, Fei Chen, Binglu Chen, Xiaotong Fang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen

Proceedings of the 2022 IEEE International Conference on Integrated Circuits, 2022

Re-LSM: A ReRAM-Based Processing-in-Memory Framework for LSM-Based Key-Value Store.

Qian Wei, Zhaoyan Shen, Yiheng Tong, Zhiping Jia, Lei Ju, Jiezhi Chen, Bingzhe Li

Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, 2022

Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage.

Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen

Proceedings of the International Conference on Compilers, 2022

2021

Flash memory based computing-in-memory system to solve partial differential equations.

Yang Feng, Fei Wang, Xuepeng Zhan, Yuan Li, Jiezhi Chen

Sci. China Inf. Sci., 2021

Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory.

Fei Wang, Yuan Li, Xiaolei Ma, Jiezhi Chen

IEEE Access, 2021

Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security.

Yifang Xi, Xiaotong Fang, Yachen Kong, Yifan Guo, Hongzhe Lin, Xuepeng Zhan, Jiezhi Chen

Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021

2020

Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions.

Yachen Kong, Meng Zhang, Xuepeng Zhan, Rui Cao, Jiezhi Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Dual-Point Technique for Multi-Trap RTN Signal Extraction.

Xuepeng Zhan, Yifang Xi, Qianwen Wang, Weiqiang Zhang, Zhigang Ji, Jiezhi Chen

IEEE Access, 2020

2019

Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2.

Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang, Yunfei En

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Program/Erase Cycling Enhanced Lateral Charge Diffusion in Triple-Level Cell Charge-Trapping 3D NAND Flash Memory.

Rui Cao, Jixuan Wu, Wenjing Yang, Jiezhi Chen, Xiangwei Jiang

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2011

Design and analysis of effective price for congestion control.

Hao Wang, Bo Wang, Jiezhi Chen, Zuohua Tian

Proceedings of the IEEE 36th Conference on Local Computer Networks, 2011

An Artificial Intelligence Approach to Price Design for Improving AQM Performance.

Hao Wang, Jiezhi Chen, Chenda Liao, Zuohua Tian

Proceedings of the Global Communications Conference, 2011