Jiefei Gu

Orcid: 0000-0002-6017-3363

According to our database¹, Jiefei Gu authored at least 5 papers between 2021 and 2024.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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Bibliography

2024

Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Informatics, August, 2024

Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection.

[BibT_eX]

[DOI]

Expert Syst. Appl., March, 2024

Flip-chip solder bumps defect detection using a self-search lightweight framework.

[BibT_eX]

[DOI]

Adv. Eng. Informatics, 2024

2023

A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2023

2021

Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation.

[BibT_eX]

[DOI]

IEEE Trans. Ind. Electron., 2021

Jiefei Gu

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