Jianhui Jiang
Orcid: 0000-0002-5829-8423
According to our database1,
Jianhui Jiang
authored at least 72 papers
between 1999 and 2024.
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Bibliography
2024
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2024
ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., August, 2024
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient.
IEEE Trans. Circuits Syst. II Express Briefs, April, 2024
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits.
IEEE Trans. Computers, January, 2024
Pattern Recognit. Lett., 2024
Bootstrap-Based Resampling Methods for Software Reliability Measurement Under Small Sample Condition.
J. Circuits Syst. Comput., 2024
Proceedings of the 24th IEEE International Conference on Software Quality, 2024
Thinking Like an Author: A Zero-Shot Learning Approach to Keyphrase Generation with Large Language Model.
Proceedings of the Machine Learning and Knowledge Discovery in Databases. Research Track, 2024
Proceedings of the 27th International Conference on Computer Supported Cooperative Work in Design, 2024
A Hierarchical Sequence-to-Set Model with Coverage Mechanism for Aspect Category Sentiment Analysis.
Proceedings of the 2024 Joint International Conference on Computational Linguistics, 2024
2023
Fast Area Optimization Approach for XNOR/OR-based Fixed Polarity Reed-Muller Logic Circuits based on Multi-strategy Wolf Pack Algorithm.
ACM Trans. Design Autom. Electr. Syst., 2023
Proceedings of the 23rd IEEE International Conference on Software Quality, 2023
Adaptive Tracing and Fault Injection based Fault Diagnosis for Open Source Server Software.
Proceedings of the 23rd IEEE International Conference on Software Quality, 2023
2022
BMC-Based Temperature-Aware SBST for Worst-Case Delay Fault Testing Under High Temperature.
IEEE Trans. Very Large Scale Integr. Syst., 2022
IEEE Trans. Very Large Scale Integr. Syst., 2022
Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Accelerating stochastic-based reliability estimation for combinational circuits at RTL using GPU parallel computing.
Int. J. Intell. Syst., 2022
CoRR, 2022
Automatic Keyphrase Generation by Incorporating Dual Copy Mechanisms in Sequence-to-Sequence Learning.
Proceedings of the 29th International Conference on Computational Linguistics, 2022
A Domain Knowledge Enhanced Pre-Trained Language Model for Vertical Search: Case Study on Medicinal Products.
Proceedings of the 29th International Conference on Computational Linguistics, 2022
Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model.
Proceedings of the IEEE 31st Asian Test Symposium, 2022
2021
A Deterministic-Path Routing Algorithm for Tolerating Many Faults on Very-Large-Scale Network-on-Chip.
ACM Trans. Design Autom. Electr. Syst., 2021
Probability gate model based methods for approximate arithmetic circuits reliability estimation.
CCF Trans. High Perform. Comput., 2021
Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal Probability.
Proceedings of the IEEE International Test Conference in Asia, 2021
Proceedings of the IEEE International Symposium on Software Reliability Engineering, 2021
Computation Offloading and Task Scheduling with Fault-Tolerance for Minimizing Redundancy in Edge Computing.
Proceedings of the IEEE International Symposium on Software Reliability Engineering, 2021
2020
IEEE Trans. Syst. Man Cybern. Syst., 2020
IEEE Trans. Netw. Sci. Eng., 2020
Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Parallel Genetic Algorithm to Extend the Lifespan of Internet of Things in 5G Networks.
IEEE Access, 2020
Arbitrary Shape Natural Scene Text Detection Method Based on Soft Attention Mechanism and Dilated Convolution.
IEEE Access, 2020
Proceedings of the 9th International Conference on Software and Computer Applications, 2020
Proceedings of the 7th International Conference on Dependable Systems and Their Applications, 2020
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
2019
IEEE Trans. Reliab., 2019
A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm.
J. Comput. Sci. Technol., 2019
Failure probability analysis and critical node determination for approximate circuits.
Integr., 2019
Neurocomputing, 2019
Proceedings of the 24th IEEE Pacific Rim International Symposium on Dependable Computing, 2019
Proceedings of the 24th IEEE Pacific Rim International Symposium on Dependable Computing, 2019
Proceedings of the 24th IEEE Pacific Rim International Symposium on Dependable Computing, 2019
A Deterministic-Path Routing Algorithm for Tolerating Many Faults on Wafer-Level NoC.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
2018
J. Electron. Test., 2018
IEEE Access, 2018
A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model.
IEEE Access, 2018
Proceedings of the 23rd IEEE Pacific Rim International Symposium on Dependable Computing, 2018
Proceedings of the IEEE International Test Conference in Asia, 2018
2017
Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017
Proceedings of the IEEE International Test Conference, 2017
2016
Microelectron. J., 2016
2015
Proceedings of the Algorithms and Architectures for Parallel Processing, 2015
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015
2014
Exploit Dynamic Voltage and Frequency Scaling for SoC Test Scheduling under Thermal Constraints.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
2013
Program behavior characterization and clustering: An empirical study for failure clustering.
Proceedings of the IEEE 24th International Symposium on Software Reliability Engineering, 2013
2012
Proceedings of the IEEE 18th Pacific Rim International Symposium on Dependable Computing, 2012
Proceedings of the 26th IEEE International Parallel and Distributed Processing Symposium Workshops & PhD Forum, 2012
2011
Intell. Autom. Soft Comput., 2011
Proceedings of the 17th IEEE Pacific Rim International Symposium on Dependable Computing, 2011
2010
Proceedings of the 16th IEEE Pacific Rim International Symposium on Dependable Computing, 2010
Proceedings of the 16th IEEE Pacific Rim International Symposium on Dependable Computing, 2010
Proceedings of the 16th IEEE Pacific Rim International Symposium on Dependable Computing, 2010
A Safe Measurement-Based Worst-Case Execution Time Estimation Using Automatic Test-Data Generation.
Proceedings of the 16th IEEE Pacific Rim International Symposium on Dependable Computing, 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009
Proceedings of the CSIE 2009, 2009 WRI World Congress on Computer Science and Information Engineering, March 31, 2009
2008
Proceedings of the 9th International Conference for Young Computer Scientists, 2008
Proceedings of the 9th International Conference for Young Computer Scientists, 2008
2003
J. Comput. Sci. Technol., 2003
1999
Proceedings of the 1999 Pacific Rim International Symposium on Dependable Computing (PRDC 1999), 1999