Jiang-Lin Wei

Orcid: 0000-0002-2952-7282

According to our database¹, Jiang-Lin Wei authored at least 19 papers between 2019 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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On csauthors.net:

Bibliography

2023

Fine-Grained Alignment for Boundary Samples under Open Set Domain Adaptation.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Conference on Multimedia and Expo, 2023

Back to the Analog Neural Network and Linear Circuit Theory.

[BibT_eX]

[DOI]

Proceedings of the 15th IEEE International Conference on ASIC, 2023

2022

IEEE754 Binary32 Floating-Point Logarithmic Algorithms Based on Taylor-Series Expansion with Mantissa Region Conversion and Division.

[BibT_eX]

[DOI]

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2022

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies.

[BibT_eX]

[DOI]

J. Electron. Test., 2022

VecLI: A framework for calculating vector landscape indices considering landscape fragmentation.

[BibT_eX]

[DOI]

Environ. Model. Softw., 2022

Innovative Practices Track: Innovative Analog Circuit Testing Technologies.

[BibT_eX]

[DOI]

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

2021

Floating-Point Inverse Square Root Algorithm Based on Taylor-Series Expansion.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2021

Floating-Point Square Root Calculation Algorithm Based on Taylor-Series Expansion and Region Division.

[BibT_eX]

[DOI]

Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021

Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2021

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2021

Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method.

[BibT_eX]

[DOI]

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production.

[BibT_eX]

[DOI]

Proceedings of the 28th IEEE International Conference on Electronics, 2021

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment.

[BibT_eX]

[DOI]

Proceedings of the 30th IEEE Asian Test Symposium, 2021

Divide and Conquer: Floating-Point Exponential Calculation Based on Taylor-Series Expansion.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International Conference on ASIC, 2021

Classical Mathematics and Analog/Mixed-Signal IC Design.

[BibT_eX]

[DOI]

Proceedings of the 14th IEEE International Conference on ASIC, 2021

2020

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE Asian Test Symposium, 2020

Revisit to Floating-Point Division Algorithm Based on Taylor-Series Expansion.

[BibT_eX]

[DOI]

Proceedings of the 2020 IEEE Asia Pacific Conference on Circuits and Systems, 2020

2019

Innovative Test Practices in Japan.

[BibT_eX]

[DOI]

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm.

[BibT_eX]

[DOI]

Proceedings of the 13th IEEE International Conference on ASIC, 2019

Jiang-Lin Wei

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