Ji-Yung Lin

According to our database, Ji-Yung Lin authored at least 6 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Backside Power Delivery in High Density and High Performance Context: IR-Drop and Block-Level Power-Performance-Area Benefits.

Yun Zhou, S. C. Song, Halil Kükner, Giuliano Sisto, Sheng Yang, Anita Farokhnejad, Mohamed Naeim, Moritz Brunion, Ji-Yung Lin, Odysseas Zografos, Pieter Weckx, Shashank Ekbote, Nick Stevens-Yu, David Greenlaw, Steve Molloy, Geert Hellings, Julien Ryckaert

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023

Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level.

Behnaz Ranjbar, Florian Klemme, Paul R. Genssler, Hussam Amrouch, Jinhyo Jung, Shail Dave, Hwisoo So, Kyongwoo Lee, Aviral Shrivastava, Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Francky Catthoor, Dwaipayan Biswas, Akash Kumar

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022

Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems.

Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor

IEEE Trans. Very Large Scale Integr. Syst., 2022

Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology.

Ji-Yung Lin, Pieter Weckx, Subrat Mishra, Alessio Spessot, Francky Catthoor

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm.

Subrat Mishra, Pieter Weckx, Odysseas Zografos, Ji-Yung Lin, Alessio Spessot, Francky Catthoor

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Fast & Accurate Methodology for Aging Incorporation in Circuits using Adaptive Waveform Splitting (AWS).

Subrat Mishra, Pieter Weckx, Ji-Yung Lin, Ben Kaczer, Dimitri Linten, Alessio Spessot, Francky Catthoor

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020