Jhon Gomez

According to our database, Jhon Gomez authored at least 10 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

Nektar Xama, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2023

2022

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Recent Trends and Perspectives on Defect-Oriented Testing.

Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, Jhon Gomez, Michelangelo Grosso, Andrea Guerriero, Iacopo Guglielminetti, Said Hamdioui, Giorgio Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu

Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

2020

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations.

Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

ACM Trans. Design Autom. Electr. Syst., 2020

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing.

Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs.

Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2020

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics.

Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2020

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing.

Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2020

2019

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs.

Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2019